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Distortion Test Targets

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Distortion Test Targets




  • Test Targets Identify Distortion in Imaging System
  • Combined Resolution and Distortion Targets Available

Features

  • Grid Distortion Test Target or Combined Resolution and Distortion Test Targets
  • Bowing of Grid Under Imaging Allows for Distortion Measurement and Correction
  • Grids Available with Pitch of 500 µm to 10 µm

Thorlabs offers three options for measuring the distortion of an optical system: one dedicated distortion grid pattern and two combined resolution and distortion test targets. The former features four grid arrays with pitches of 500 µm, 100 µm, 50 µm, and 10 µm. Alternatively, our 18 mm x 18 mm combined resolution and distortion target has three grid arrays with pitches of 100 µm, 50 µm, and 10 µm, as well as a 1951 USAF pattern, a sector star (also known as Siemens star), concentric circles, and Ronchi rulings. This target is offered as a positive or negative pattern. Finally, our 3" x 1" combined target has three dot arrays with 400 µm, 200 µm, and 100 µm pitches and Ø80 µm, Ø40 µm, and Ø20 µm dots, respectively, as well as an NBS 1963A pattern, a sector star, concentric circles, fixed and variable frequency Ronchi rulings, pinholes, and more.

Made from soda lime glass substrates, these targets are useful for determining the distortion of an imaging system, as the horizontal and vertical lines of the grid or the rows and columns of solid circles are perpendicular to each other and will be imaged as such by an ideal system. A distorted image will show the lines or rows and columns of dots as bowed; this image allows the user to quantify the distortion and thus to correct for it.

 


Grid Distortion Target, 3" x 1" (76.2 mm x 25.4 mm)

  • Ideal for Stage Calibration and Distortion Detection
  • Four Grid Arrays on a 3" x 1" (76.2 mm x 25.4 mm) Glass Slide
  • 500 µm, 100 µm, 50 µm, and 10 µm Grids

Grid arrays are used to determine the distortion of an imaging system as the horizontal and vertical lines of the grid should be perpendicular to each other. A distorted image will show the lines as bowed; this image can then be used to correct for distortion. Our R1L3S3P positive grid array features four chrome grids on a 3" x 1" soda lime glass slide. The grid arrays have 500 µm, 100 µm, 50 µm, and 10 µm spacings.

 

Combined Resolution and Distortion Test Targets, 18 mm x 18 mm (0.71" x 0.71")

  • Determine Resolution of an Optical System
  • Measure Image Distortion, Astigmatism, and Other Aberrations
  • 18 mm (0.71") Square, 1.5 mm Thick Target
  • Includes 1951 USAF Pattern, Sector Star, Concentric Circles, Grids, and Ronchi Rulings
  • Positive and Negative Patterns Available
  • Compatible with our MLS203 Microscope Stages and MLS203P8 Slide Holder

Thorlabs offers positive and negative 18 mm x 18 mm combined resolution / distortion test targets that are made by plating chrome on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. They are sized to fit in our MLS203P8 stage slide holder for use with our MLS203 Microscope Stages.

The test targets include a 1951 USAF pattern (Groups 2 - 7), a sector star, concentric circles, grids (100 µm, 50 µm, and 10 µm), and Ronchi rulings (30 - 150 lp/mm). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The USAF 1951 targets are useful for measuring imaging resolution. For more information, please see our Resolution Targets page. The grids can be used to measure image distortion, while the concentric circles are ideal for identifying focus errors, astigmatism, and other aberrations existing in an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability.

 

Combined Resolution and Distortion Test Targets, 3" x 1" (76.2 mm x 25.4 mm)

  • 3" x 1" (76.2 mm x 25.4 mm) Target
  • Includes NBS 1963A Pattern, Sector Star, Concentric Circles, Grids, Ronchi Rulings, and More (See Table Below)
  • Determine Resolution of an Optical System
  • Measure Image Distortion, Astigmatism, and Other Aberrations
  • Compatible with our MLS203 Microscope Stages and MLS203P8 and MLS203P2 Slide Holders

Thorlabs offers positive 3" x 1" (76.2 mm x 25.4 mm) combined resolution / distortion test targets that are made by plating chrome on a soda lime glass substrate. They are ideal for calibration of imaging systems and microscope stages. They are sized to fit in our MLS203P8 and MLS203P2 stage slide holders for use with our MLS203 Microscope Stages.

The test targets include an NBS 1963A pattern, a sector (Siemens) star, concentric circles, grids, Ronchi rulings, and more (see table below). These targets are useful for testing resolution, field distortion, focus errors, and astigmatism. The NBS 1963A, sector star, and concentric circle targets are useful for measuring imaging resolution. For more information, please see our Resolution Targets page. The grids can be used to measure the distortion introduced by an imaging system. The Ronchi rulings are excellent for evaluating resolution, field distortion, and parfocal stability.

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Our Mission is to accelerate the advancement of optical technology for precision measurements and their applications from the table tops of research laboratories to standard use in communication and high technology industries. Our aim is to serve our customers. Our hope is to create a place for highly skilled people in an open environment

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